By Dean Landers

Abstract:

Failures in EMC testing often result in treating the symptoms of the issue rather than attacking the source. If we know the source of the issue rather than chase the symptoms, we will save time, cost, and frustrations. In this discussion, we will attack EMC testing from a component standpoint so that when issues arise, we can pinpoint the solution, saving time, cost, and frustrations.

Dean Landers is the Supervisor of Application Engineers for AR RF/Microwave Instrumentation. He is actively engaged in new application and product development, system development and integration, customer support, and training with hardware demonstrations for both customers and company personnel. Prior to working at AR RF/Microwave Instrumentation, Dean spent nine years as an EMC Test Engineer at Retlif Testing Laboratories. He managed military, commercial aviation, commercial test programs, writing customer test procedures, and working with customers to help them understand their compliance needs and requirements. He also serves as the current chair of the Philadelphia IEEE EMC Chapter.

Next up? Are you interested in learning more about recent advancements in EMC, Signal and Power Integrity technologies? If so, join us IN-PERSON August 1-5, 2022 for the 2022 IEEE INTERNATIONAL SYMPOSIUM ON ELECTROMAGNETIC COMPATIBILITY, SIGNAL & POWER INTEGRITY.

Remember: The deadline to submit Abstract-Reviewed Papers as well as proposals for Experiments & Demonstrations and Workshops & Tutorials is March 7, 2022! See other upcoming Key Dates on the symposium website!