TUESDAY, AUGUST 8, 2017
Hands-On Verification of EMC Transients Waveforms:

CE, Automotive, MIL-STD-461
    Jamison Berg and Gabe Alcala of Advanced Test Equipment Rentals,

    San Diego, CA, USA

Using Real-Time Spectral Analysis for Faster Troubleshooting of Radiated & Conducted Emissions and Co-Located Wireless Systems
    Lee Hill, SILENT Solutions LLC & GmbH, Worcester Polytechnic Institute (WPI),

    Amherst, NH, USA

Incorporating Equipment Under Test (EUT) Monitoring within Immunity Testing
    Jack McFadden, ETS-Lindgren, Cedar Park, TX, USA

EMC Simulation for Early Stage Analysis and Troubleshooting of DC-DC Converter Conducted Emissions
     Yushi Tan, CST of America, LLC, Framingham, MA, USA

Time Domain Site VSWR Measurements
     Zhong Chen, ETS-Lindgren, Cedar Park, TX, USA

5G Performance Measurements
     Jari Vikstedt, ETS-Lindgren, Cedar Park, TX, USA

Impact of Cable Shield Terminations on Emissions Performance
     Matt Juszczyk and Juan Valles, Rockwell Collins, Cedar Rapids, IA, USA

Comprehensive Space Plasma EMC Analysis Using a Single Model
     Bryon Neufeld, EMA, Denver, CO USA

WEDNESDAY, AUGUST 9, 2017
Transmission Line Reflections at a Load and at a Discontinuity
     Dr. Bogdan Adamczyk, Grand Valley State University, Grand Rapids, MI, USA

Conducted Transients on Spacecraft Primary Power Lines
     John McCloskey and Jen Dimov, NASA/Goddard Space Flight Center,

     Greenbelt, MD, USA

Improving Pulsed/Intermittent Signal Measurements Utilizing Time Domain Scan and Real-Time Spectrum Analysis
     Bill Wangard, Rohde & Schwarz, Kildeer, IL, USA

Hybrid PEEC/MTL Solution for Analysis of Transmission-line Effects on PCB
     Irina Oganezova, EMCoS Ltd., Tbilisi, Georgia

Frequency Spectra of Transients
     John McCloskey and Jen Dimov, NASA/Goddard Space Flight Center,

     Greenbelt, MD, USA

Measuring Shielding Effectiveness at the IC Level
     Stephan Pfennig, Langer EMV-Technik GmbH, Bannewitz, Germany

Distinguishing Common Mode from Differential Mode Conducted Emissions
     Jerry Meyerhoff, JDM Labs LLC, Buffalo Grove, IL, USA

Modeling and Simulation of Cable Harness Radiation and Susceptibility for Automotive and Aircraft Structures
     Dr. Marius H. Vogel, Altair Engineering, Inc., Hampton, VA, USA

THURSDAY, AUGUST 10, 2017
ESD Measurement Techniques with Oscilloscopes
      Mike Hertz, Teledyne LeCroy, MI, USA

Control of Electric and Magnetic Radiated Emissions at Low and High Frequencies
      Pablo Narvaez and Charles Rhoads, Jet Propulsion Laboratory,

     California Institute of Technology, Pasadena, CA, USA

A Simulation Workflow for Interference-Free Design of Electronic Devices
     Dr. Fred German, ANSYS, Inc., Champaign, IL, USA