ITC Announces Invited Speaker List

The International Test Conference has an incredible program for this year's meeting in Seattle. We are pleased to announce the most powerful slate of invited talks in the history of our conference, covering a wide range of topics from the changing characteristics of test in the most advanced (FinFET) technology nodes all the way to the role of test for the internet of everything. Stay tuned for details of our conference, which will be released as our Advance Program in the very near future. Here are some of the invited speakers that are coming to ITC2014. We hope to see you there as well.
Paul Ryan Intel Leading Edge Defect Trends and the Strategic Test Gaps They Expose		Bong Hyun Lee Samsung Thermal-Aware Mobile SoC Design and Test in 14nm Finfet Technology
Saman Adham TSMC The Importance of DFX, A Foundry Perspective		Sajjad Pagarkar Qualcomm Challenges of Testing 100M Chips
Greg Yeric ARM Design, Technology and Yield in the Post-Moore Era		Yue Liang NVIDIA Yield and Performance Improvement Through Technology-Design Co-optimization in Advanced Technology Nodes
Yervant Zorian Synopsys Design, Test & Repair Methodology for FinFET-based Memories		Keith Bowman Qualcomm Trading-Off On-Die Observability for Cache Minimum Supply Voltage Reduction in System-on-Chip (SoC) Processors
TM Mak GLOBALFOUNDRIES Interposer Test - Testing PCBs that Have Shrunk 100x		Madhavan Swaminathan Georgia Tech Managing Signal, Power and Thermal Integrity for 3D Integration
Boris Murmann Stanford Teaching an Old Dog New Tricks: Views on the Future of Mixed-Signal IC Design		Mani Soma University of Washington Analog Fault Models: Back to the Future?
Georges Gielen KU Leuven, Belgium Design and Testing of Analog Circuits at PPM Level		Brian Floyd NC State University Market Opportunities and Testing Challenges for Millimeter-Wave Radios and Radars
Harry H. Chen MediaTek The Case for Analyzing System Level Failures Using Structural Patterns		Bianca Schroeder University of Toronto A Tale of Two Lives: Under Test and in the Wild
Wolfgang Kunz Technische Universitat Kaiserslautern Software in a Hardware View: New Models for HW-dependent Software in SoC Verification and Test		Kenneth Larsen Mentor Graphics Emulation and its Connection to Test
Guillaume Brat NASA Ames Research Center Compositional Verification Using Formal Analysis for a Flight Critical System		Anne Gattiker IBM Big Data and Test
Sree Rajan Fujitsu Big Data Analytics for Security of Large-Scale Systems		Steve Trimberger Xilinx Security Solutions in the First-Generation Zynq All-Programmable SoC
Pradip Bose IBM Energy-Secure Computer Architectures		Haydn Povey ARM Delivering Security by Design in the Internet of Things
Sascha von Meier UC Berkeley Recruiting Distributed Resources for Grid Resilience: The Need for Transparency		Mani Vadari Modern Grid Solutions Dynamic Microgrids - A Potential Solution for Enhanced Resiliency in Distribution Systems
Kevin Schneider Pacific Northwest National Laboratory Microgrids as a Resiliency Resource

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