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The NaioAFM from Nanosurf is the ideal atomic force microscope for nanoeducation and small sample measurements. This all-in-one AFM system provides solid performance and easy handling, with a price tag and footprint that fit anyone and any place.
Key features:
- Integrated controller, airflow shielding, vibration isolation, and XY-table (12 mm)
- High resolution top view camera and side view sample observation built in
- Feature-complete: All standard operating modes available
- Simple cantilever exchange: no laser or detector adjustment required
- No system setup needed: just plug into your PC and start the software
- User-friendly software wizards quickly prepare measurement parameters
- A low-cost AFM solution for any budget!
For further details please refer to the datasheet:
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Regards,
Christian Loebbe
Scitech Pty Ltd
Email:
[email protected]
Ph: +61 3 9480 4999
Mob: 0400 440 426
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