AFMWorkshop and Dalia Yablon, Ph.D. of Surface Char LLC, are pleased to announce the launch of: Laboratory -Based Curriculum for Atomic Force Microscopy: Atomic force microscopy to make nanoscale material and topographic measurements of materials.
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| A new undergraduate AFM Curriculum available from AFMWorkshop and SurfaceChar |
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This all-inclusive curriculum introduces students to the technology and instrumentation of atomic force microscopy. The background of the hardware and operating principles are reviewed, including the main modes covered in the labs: contact mode, tapping mode, and force spectroscopy.
Important applications of atomic force microscopy are discussed in the context of the laboratory assignments. Image processing with the freeware Gwyddion is used for various analyses associated with the labs. The curriculum contains a pre-lab quiz and analysis/questions for further discussion of each laboratory. Answers are provided in the accompanying Teacher Manual. Aside from the AFM instrument, no other material or parts are necessary!
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Objectives of the AFM Curriculum include:
- Learn the basic operating principles behind atomic force microscopy.
- Understand and operate the main modes of AFM: contact mode, tapping mode, force spectroscopy.
- Operate an AFM to measure topography and compositional differences of a sample on the nanoscale.
- Conduct basic analysis on images, including statistics and cross-sectional measurements.
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An AFM Probe Kit and an AFM Sample Kit are included
with the new AFM Curriculum
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Student Guide
Covers the background of AFM operation, modes, and application. Includes a step-by-step series of labs on contact mode, tapping mode, and force spectroscopy. This section also includes a pre-lab quiz for students as well as suggested analysis questions to be answered in the lab report write-ups.
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Laboratory Experiments detailed through the curriculum are:
- Measuring Roughness of Thin Films
- Measuring Compositional Heterogeneity of Everyday Materials
- Metrological Measurements
- Probing Mechanical Properties of a Substrate
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|  The TT-AFM
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| A great AFM for less than $30K |
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The TT-AFM is
AFMWorkshop's most popular and multi-use AFM. Over 150 laboratories have purchased the TT-AFM within the past 5 years and it's already been cited in nearly 100 publications.
The TT-AFM was intentionally designed to meet high- performance needs for a low cost. It's an extremely versatile and robust AFM suitable for research, industry and education. We invite you to view some of the TT-AFM's images and to learn more about the TT-AFM's capabilities, including:
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Multiple scanning modes, including vibrating, non-vibrating, phase and LFM are all standard. The TT-AFM can utilize almost any manufacturer's probes, and can accomodate sample sizes up to 1"x1"x1/4".
Operating software is open-source, and the AFM's design is open architecture. Users can modify as much or as little of their system as desired.
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- June 13-17, 2016
Learn to Assemble, Operate and Repair the TT-AFM
Signal Hill, California
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From the March, 2016
TT-AFM Workshop
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A still shot from animated series #2 on Vibrating Mode for AFMs
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A very popular step-by-step animation series, currently includes :
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from Oxford University Press, by Peter Eaton and Paul West. Order yours today from Amazon.com.
"...a great introduction to AFMs for beginners and also serves as a good starting point for more serious users."
Udo D. Schwarz,
Yale University
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